Apparatus for determining deformation response

ABSTRACT

One aspect of the inventive technology may be generally described as a method for determining test object deformation response that comprises the steps of moving a deformation force deliverer  1  to deliver deformation force  24  to a test object  3 ; adjusting a deformation force deliverer affecting input so as to meet at least one constraint while performing the step of moving the deformation force deliverer  1 ; deforming the test object  3  with the deformation force  24 ; and determining test object response to the deformation force. Corollary apparatus, in addition to other inventive apparatus and method aspects relating variously to test object deformation response determination are part of the inventive technology. Such aspects may relate to the use of a linear actuator  15  in a test object deformation and to identity of motion of a deformation force deliverer  3  and a force deliverer drive component  75 , as herein described.

This application is a continuation application of, and claims benefit ofand priority to, U.S. patent application Ser. No. 12/663,836, issuing onApr. 17, 2012 as U.S. Pat. No. 8,156,825, said application filed Dec. 9,2009 (published as publication number US 2010/0170348 A1 on Jul. 8,2010), which itself is the United States National Stage of internationalpatent application number PCT/US2008/066596, filed Jun. 11, 2008(published as WO 2008/154598 A2 on Dec. 18, 2008), which itself claimspriority to and benefit of U.S. Provisional application 60/934,210,filed Jun. 11, 2007, all of said applications hereby incorporated hereinin their entirety.

TECHNICAL FIELD

Generally, the inventive technology may find application in the field oftesting of objects for response to a deformation. In particular, theinventive technology may find application whenever information relativeto deformation response, including but not limited to deformation forcevs. deformation position, life cycle response, and/or applicationspecific responses (e.g., electrical switch performance), is valuable.

BACKGROUND

Materials exhibit deformation in response to a force. The amount offorce necessary to generate a specific deformation, the speed ofdeformation at a specific position between undeformed and maximallydeformed position, the onset of plastic deformation, are just three ofmany parameters that may characterize deformation response of a testobject. Depending on the specific test object, other parameters, such aselectrical resistance in the case of force activated electrical switchdomes (which may be pressed by an operator to input data and may befound in a variety of electrical appliances and devices) may revealvaluable information about its switch-related functionality (e.g., willit function as a switch after 1,000,000 cycles?). Deformation force vs.deformation position (also referred to as displacement, or travel in theindustry) information may provide information relevant to thefunctionality, suitability and/or applicability of a variety of testobjects, whether they be materials, devices, contiguities, etc.

A classic example of an apparatus adapted to test performance is switchdome testers, which may be adapted to test force vs. displacement (ordeformation position), electrical response, or life cycle response inorder to characterize functionality, suitability and/or applicability ofexisting or intended switch designs. The most predominant type of suchtester include strain gauges established in a cantilevered bar adaptedto exhibit an enhanced deformation (due to vacuations established atnon-terminal portions of the cantilever) in response to a load appliedat one end. A deformation drive is supplied at a non-terminal site ofthe cantilever such that the strain gauges are between such non-terminalsite and that site from which a “finger” that delivers a deformationforce to the dome below is located. Electrical readings from such gagescan then be used to generate force vs. displacement (also known astravel or deformation or simply position) data. Notably, such apparatusdo not adjust an input to meet a constraint, do not exhibit a drivecomponent and force deliverer that move simultaneously at the same speedand acceleration, and do not use a linear actuator in any fashion.Further, such apparatus may be limited in applicability, accuracy,reliability, durability, cyclical speed, controllability and/or range ofapplied force.

It is a goal of at least one embodiment of the inventive technology toprovide an apparatus and method that, with an enhanced (relative toprior art apparatus and methods) delivered force range and cyclicalspeed may have application not only in the field of switch dome testingbut also in the field of testing for elastic response and hardness. Suchenhanced ranges and speeds (e.g., in cycles per second and/ordeformation speed) may be the result of the use of a voice coil basedlinear actuator. Indeed, embodiments of the inventive technology affordsignificant increases in cycles per second for reliability/life/cyclicalresponse testing (greater than about 10 cycles per second, between about10 to about 20 cycles per second, about 20 cycles per second, and, incertain embodiments, perhaps greater than about 20 cycles per second ormore).

It is a goal of at least one embodiment of the inventive technology toprovide an apparatus and method that relies on an input-based controlscheme, thereby affording an enhanced level of control and one that, inparticular embodiments, is more suited to certain types of testing,particularly those where accelerative and inertial effects may introduceerror to test results.

It is a goal of at least one embodiment of the inventive technology toprovide an apparatus and method that exhibits improved ability torecreate a test over several actuation cycles on different test objects(e.g., different force activated switch domes, or buttons).

It is a goal of at least one embodiment of the inventive technology toprovide an apparatus and method that exhibits improved accuracy incontrol of testing parameters, particularly over many deformations(e.g., 100,000 cycles), and, in certain embodiments provide controlsufficient to replicate actual deformation force characteristics (e.g.,speed, acceleration, force) to improve characterization of response,whether in singular force application or cyclic testing mode.

It is a goal of at least one embodiment of the inventive technology toprovide an apparatus and method that exhibits an improved ability toquantify reliability (e.g., the number of cycles until switch failure)of a test object designed to undergo cyclical deformation (e.g., a forceactivated switch dome).

It is a goal of at least one embodiment of the inventive technology toprovide an apparatus and method that exhibits an improved ability totest mechanical response (mechanical decay) and electrical response(electrical decay) of, e.g., force activated switch domes, over repeatedcyclic actuations.

Of course, other objects and advantages of the inventive technology maybe disclosed in the sections that follow.

DISCLOSURE OF THE INVENTIVE TECHNOLOGY

One aspect of the inventive technology may be generally described as amethod for determining test object deformation response that comprisesthe steps of moving a deformation force deliverer to deliver deformationforce to a test object; adjusting a deformation force delivereraffecting input so as to meet at least one constraint while performingthe step of moving the deformation force deliverer; deforming the testobject with the deformation force; and determining test object responseto the deformation force. Corollary apparatus, in addition to otherinventive apparatus and method aspects, relating variously to testobject deformation response determination are part of the inventivetechnology. Such aspects may relate to the use of a linear actuator in atest object deformation and to identity of motion of a deformation forcedeliverer and a force deliverer drive component, as herein described.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a perspective view of a test station embodiment of theinventive apparatus.

FIG. 2 shows a side view of a prior art switch dome tester.

FIGS. 3A and B show a side and top view of a portion of a cantilever ofa prior art tester, including strain gages.

FIG. 4 shows a side view schematic of a voice coil embodiment of theinventive technology.

FIG. 5 shows a side view schematic of a voice coil embodiment of theinventive technology.

FIGS. 6A and B show side view schematics of embodiments of the inventivetechnology.

FIG. 7 shows a side view schematic of an embodiment of the inventivetechnology.

FIG. 8 shows a perspective view of a test station embodiment of theinventive apparatus.

FIG. 9 shows a side view of a test station embodiment of the inventiveapparatus.

FIG. 10 shows a front view of a test station embodiment of the inventiveapparatus.

FIG. 11 shows a perspective view of an interface, test object blocklocator, and deformation force deliverer of a test station embodiment ofthe inventive apparatus.

FIGS. 12A and B show a perspective rear and a front view of a teststation embodiment of the inventive apparatus.

FIGS. 13A and B show a perspective side and perspective front view of atest station embodiment of the inventive technology. FIG. 13C shows acloseup view of a deformation force deliverer in contact with a testobject on a test object block locator while FIG. 13D shows a closeupview of a deformation force deliverer above a test object on a testobject block locator.

FIG. 14 shows a closeup view of a deformation force deliverer in contactwith a test object on a test object block locator.

FIG. 15A shows a power cord and software; FIG. 15B shows a rearperspective view of a test station embodiment of the inventivetechnology.

FIGS. 16A and B show a side perspective view and a direct side view,respectively, of a linear actuator that may find application in theinventive technology.

FIGS. 17A and B show side and top perspective views, respectively, of aservo-controller that may find application in the inventive technology.FIG. 17C shows electronics inside the interface of a test stationembodiment of the inventive technology. FIG. 17D shows an exposed base,and internal componentry, as linked with a laptop computer andinterface.

FIG. 18 shows a flow chart that presents primary computational/codesteps of software that may find application in the inventive technology.

FIG. 19 shows a deformation force vs. deformation position (travel)curve, and associated data, for a specific test object (a forceactivated switch dome in this case).

FIG. 20 shows a deformation force vs. deformation position (travel)curve for a specific test object (a force activated switch dome in thiscase).

FIG. 21 shows numerical results of certain response parameters asgenerated by a switch dome test.

FIG. 22 shows a trip force vs. cycles graph generated by a switch dometest.

FIG. 23 shows a successful switch closure vs. cycles generated by aswitch dome reliability (cyclical response) test.

FIG. 24 shows a calibration curve.

FIG. 25 shows a diagram of a test station embodiment as configuredduring calibration.

FIG. 26A-E show possible screens as they may appear on a screen (whetheron the interface or on a stand-alone computer such as a laptop). FIG.26F shows a laptop with a screen showing a force vs. displacement curve,in addition to showing how a plurality of test stations and computersmay be linked through a network.

FIG. 27 shows a diagram of a test station embodiment of the inventivetechnology.

FIG. 28 shows a diagram of an interface of a test station embodiment ofthe inventive technology.

FIG. 29 shows an assembly diagram of a linear actuator that may findapplication in a test station embodiment of the inventive technology.

FIG. 30 shows an assembly diagram of a part of the interface of a teststation embodiment of the inventive technology.

FIG. 31 shows an assembly diagram of a part of the interface of a teststation embodiment of the inventive technology.

FIG. 32 shows an assembly diagram of button (switch dome) used as partof the interface of a test station embodiment of the inventivetechnology.

FIGS. 33A and 33B show assembly diagrams of a housing of the interfaceof a test station embodiment of the inventive technology.

FIG. 34 shows an assembly diagram of a housing of the interface of atest station embodiment of the inventive technology.

FIG. 35 shows an assembly diagram of a housing of the interface of atest station embodiment of the inventive technology.

FIG. 36 shows an assembly diagram of a base of a test station embodimentof the inventive technology.

FIG. 37A shows an assembly diagram of a base of a test stationembodiment of the inventive technology; FIGS. 37B and C show photosthereof.

FIG. 38 shows an assembly diagram of a base of a test station embodimentof the inventive technology.

FIGS. 39A and B each show an assembly diagram of a base of a teststation embodiment of the inventive technology.

FIGS. 40A, B and C show photographs of a circuit board that may findapplication in a test station embodiment of the inventive technology.FIG. D shows a schematic of the board, with data acquisition card.

FIGS. 41A and B show photographs of a circuit board that may findapplication in a test station embodiment of the inventive technology.FIG. C shows a schematic of the board, with central processing unit.

FIG. 42 shows an assembly drawing of structural components of a teststation embodiment of the inventive technology.

FIG. 43 shows an assembly drawing of a structural board of a teststation embodiment of the inventive technology.

FIG. 44A shows an assembly drawing (A is perspective view; B is sideview) of a support arm of a test station embodiment of the inventivetechnology.

FIG. 45 shows an assembly drawing (A is rear perspective view; B isfront perspective view; C is a side view) of an interface plate of atest station embodiment of the inventive technology.

FIG. 46 shows a photograph of components as they may appear before finalassembly of a test station embodiment of the inventive technology.

FIG. 47 shows how FIGS. 48A-48G relate to one another in an electricalschematic of electrical aspects of a test station embodiment of theinventive technology.

FIG. 48A-48G are the enlarged portions of FIG. 47.

FIG. 49 shows how FIGS. 50A-50C relate to one another in an electricalschematic of electrical aspects of a test station embodiment of theinventive technology.

FIG. 50A-50C are the enlarged portions of FIG. 49.

FIG. 51 shows how FIGS. 52A-52F relate to one another in an electricalschematic of electrical aspects of a test station embodiment of theinventive technology.

FIG. 52A-52F are the enlarged portions of FIG. 51.

MODE(S) FOR CARRYING OUT THE INVENTION

As mentioned earlier, the present invention includes a variety ofaspects, which may be combined in different ways. The followingdescriptions are provided to list elements and describe some of theembodiments of the present invention. These elements are listed withinitial embodiments, however it should be understood that they may becombined in any manner and in any number to create additionalembodiments. The variously described examples and preferred embodimentsshould not be construed to limit the present invention to only theexplicitly described systems, techniques, and applications. Further,this description should be understood to support and encompassdescriptions and claims of all the various embodiments, systems,techniques, methods, devices, and applications with any number of thedisclosed elements, with each element alone, and also with any and allvarious permutations and combinations of all elements in this or anysubsequent application.

A particular aspect of the inventive technology may be generallydescribed as a method for determining test object deformation responsethat comprises the steps of moving a deformation force deliverer 1(e.g., an extended shaft of, e.g., a linear actuator 15) to deliverdeformation force 24 to a test object 3; adjusting a deformation forcedeliverer affecting input so as to meet at least one constraint whileperforming (e.g., simultaneously, or in rapid alternating fashionperhaps) the step of moving the deformation force deliverer 1; deformingthe test object 3 with the deformation force; and determining testobject response to the deformation force. Test object deformationresponse may include, perhaps most significantly, deformation force vs.deformation position (travel or displacement) and deformation speed vs.deformation position (where deformation position may simply be anindication of the extent of deformation, or travel, or displacementduring deformation, such as 0.63 mm, of a point on the test object).

Other parameters that may be generated in characterization of responseinclude but are not limited to: trip force, return force, minimum force,standing free height, displacement (travel), tactile ratio, contactbounce (e.g., a duration of instability of a switch state afteractuation), tactile slope, electrical resistance, tease force, teasetravel, release, tactile recovery slope, resistance threshold, testingresistance, bounce time, force required, maximum resistance, number ofcycles, impact speed, and displacement velocity. Generally, particularlywhen the test object is a force activated switch dome, mechanical,electrical and reliability response, such as force vs. displacement,electrical functionality, and life cycle response (e.g., how repeatedactuation cycles affect both electrical and mechanical response), aretested. Certain inventive apparatus and methods able to test forceactivated switch domes may be able to capture response in numericaland/or graphical form as described by ASTM switch testing standardsF1570-01; F1597-02; F1682-02; F1997-99. Of course, some of theafore-mentioned parameters (e.g., electrical resistance), may berelevant only when certain test objects, such as force activated domeswitches, are tested.

As there are a wide variety of applications of the inventive technology,there are a wide variety of test objects. Broadly, they include anyobjects whose response to a deformation force is of interest (wheredeformation force is any force that causes a deformation, regardless ofhow small, whether elastic and/or plastic). Such response may becharacterized as elastic response, hardness response (e.g., when doesthe material initiate elastic and/or plastic deformation?), and/orcyclical response (e.g., when does the material fail under repeatedloading?; how is the deformation force vs. deformation position curvedifferent after 10,000 cycles?), as but a few examples. Of course, acycle includes a single deformation and release to undeformed state(e.g., a depression of a switch dome with a finger to close a circuit,and a release of such deformation force so the dome returns to itsundeformed configuration). Test objects more specifically include, butare by no means limited to: force activated switch domes, forceactivated switch components (e.g., tactile switches with shapes otherthan dome), buttons (e.g., as part of a switch, and which include forceactivated domes), elastomeric materials, mattresses, fabricatedmaterials, fruits and vegetables (for, perhaps, freshnesscharacterization), metals, composite materials, springs, items/devicesused or deformed in any fashion repeatedly (e.g., car door handles) andgems. Of course, the inventive technology may be found in automatedfashion as part of product quality control, perhaps in an assembly line,as but one of many applications.

It should be understood that a deformation is considered to occur evenwhere it might not be observable by the human eye. Indeed, forparticular embodiments of the inventive technology to work properly whenthe deformation is “unobservable”, all that is needed is a sensor thatcan notice such small deformations (perhaps a linear encoder, includinga sensitive photo-eye and a magnified linear, marked slide). Asparticular embodiments may require sensing changes in deformationposition that occur when a very hard material is impacted by, e.g., thedeformation force deliverer, particularly sensitive equipment may benecessary to determine test object response.

The deformation force deliverer includes the off-drive components(including, e.g., an extended linear actuator shaft and any tip 5 onsuch shaft that may directly apply the force to a test object) that moveto deliver a deformation force to a test object. It is of note thatwhere a claim limits deformation force deliverer motion or behavior in acertain manner, as long as at least one part of a deformation forcedeliverer moves or behaves in such manner, such claim limitation is saidto be met. As such, where a claim limits deformation force delivererspeed and/or acceleration in some manner (e.g., such is/are identical tothat observed by the deformation force deliverer drive), and a rubbertip of the force deliverer exhibits, during deformation of the testobject, a different speed and/or acceleration than the rest of the forcedeliverer because the tip itself deforms more than the rest of thedeliverer during test object deformation, such phenomenon (i.e., suchdifferential speed among components of the force deliverer) will notpreclude coverage of such “differently-tipped” type design. Such rubbertip may find use in certain types of cyclical failure testing of forceactivated electrical switch domes. They typically are not used whendetermining a simple force vs. displacement (or travel) curve because ofthe inertial and accelerative effects, and resultant error, that may beintroduced.

The step of adjusting a deformation force deliverer affecting input soas to meet at least one constraint may comprise the step of adjusting adeformation force deliverer affecting input so as to meet at least onedeformation force deliverer motion constraint, such as a constant speedconstraint, a constant acceleration constraint (which may be a betterreplicant of a finger applied force), and/or deformation force delivererposition extrema constraints (which may correspond with an undeformedtest object configuration and a maximally deformed test objectconfiguration). It should be noted that instead of using two extrema,other motion range control schemes can be used (e.g., stop at 110% ofdeformation force). As can be readily understood, a deformation forcedeliverer affecting input is that input that, when changed, causes achange in the deformation force deliverer (e.g., the motion thereof, orthe force delivered thereby).

Often, when the constraint is a deformation force deliverer motionconstraint, the step of determining test object response comprises thestep of determining deformation force as it relates to deformationposition. When the constraint is a deformation force deliverer motionconstraint, the step of adjusting a deformation force delivereraffecting input may comprise the step of using a servo-controller 11 anda linear encoder 12 (which may or may not be part of a linear actuator),and/or the step of determining test object response may comprise thestep of reading recorded calibration data. The servo-controller (onemanufactured by SMAC™, e.g.) may, perhaps through use of a proportionalintegral derivative controller, use measured data (perhaps deformationspeed, acceleration and/or deformation position that may be measuredwith a linear encoder) to determine whether and by how much input (e.g.,current, or perhaps pneumatic pressure) should be adjusted to meet aconstraint. It can then adjust input as necessary. It is of note that,particularly where that part that contacts the test object and appliesthe deformation force (a deformation force deliverer tip) is of the samematerial as the deformation force deliverer (e.g., they have the sameelastic response), deformation position may be directly associated with,and even identical with, force deliverer position (e.g., both may havetraveled the same amount in one test cycle). As mentioned, a rubber tipmay be used (e.g., in certain cyclical testing), perhaps to betterreplicate the force applied by a human finger.

Calibration data, which may relate force to deformation force delivererposition, e.g., the vertical position or the deformation force deliverer(which may be directly related, perhaps identical, to deformationposition or displacement of the test object) to deformation force andinput current, may be generated in the following manner: a first mass 13may be configured (e.g., suspended, perhaps in levered fashion) so as todeliver a known force to the deformation force deliverer (perhaps in adirection opposite that of the deformation force delivered thereby).Current to a device that drives the deformation force deliverer (e.g.,current to a linear actuator) may be then controllably increased (e.g.,at a constant rate) while position data is recorded for a plurality ofcurrent values, up to an appropriately high value (which would beobvious to the calibrating technician and may depend on the displacementrange necessitated by an anticipated testing application(s)). Data forsuch mass may then be recorded. These steps would be repeated for avariety of masses that would sufficiently cover the range of expectedforces for the anticipated testing application(s). An example of a fewcalibration data points could be: for 100 grams, at 0.23 mm ofdisplacement, a current of 3.01 amps; for 100 g., at 0.27 mm ofdisplacement, a current of 3.42 amps; for 200 g., at 0.23 mm ofdisplacement, a current of 5.28 amps; for 200 g., at 0.27 mmdisplacement, a current of 5.72 amps. The data may be presented on agraph with a horizontal (“x”) axis of deformation force delivererposition, a vertical (“y”) axis of applied current (or correspondingvoltage), and a series of perhaps curves (e.g., lines), each associatedwith a specific mass (see, e.g., FIG. 25). If the goal is to determinedeformation force, such curves could be used (perhaps the computer woulduse the actual data that such curves represent) by using a computercomponent to read (a term that includes interpolate) which force (ormass) is associated with known deformation position (which may bemeasured by a linear actuator) and known current data. If the goal is todetermine current to be applied to generate a constant force, such datacould be also be useful, in ways that would be apparent to one ofordinary skill in the art. Determining either force (e.g., in adeformation force deliverer motion constraint application), or, on theother hand, current (e.g., current needed to meet a force constraint,such as to maintain a specific, constant force), will often requireinterpolation between measured calibration data (typically between twomasses). It may be that, instead of the “brute force”, mass-by-masscalibration, a mathematical relationship usable to generate force frommeasured position and current data may be generated.

Of course, if a constant deformation speed (displacement speed) is aconstraint, current may be increased or decreased by theservo-controller 11 when readings from the linear encoder 12 indicatethat speed is falling slightly below, or rising slightly above, theconstant deformation speed constraint. Recorded calibration data, whichmay relate force to position and current, may then be used to generateforce vs. deformation position values (current and position are known ormeasured, and, from such measurements, deformation force can beestimated at each deformation position using calibration data). When aconstraint relates to motion of the displacement of the test object(e.g., speed or acceleration of deformation), and particularly when thetest object is a force activated switch dome (including but notnecessarily limited to what are known as bi-stable domes), it is of notethat the test object may be said to exhibit a constant speed even whenmovements at the very beginning of the deformation and after the tripforce is met are not constant (but perhaps all other movements are). Ofcourse, in a typical force delivery (e.g., half of a cycle), the forcedeliverer must be first accelerated from zero speed (so, at such initialtimes, speed is not and cannot be constant), and, again, particularlywith regard to testing of certain force activated switch domes (with adeformation force applied in the positive direction of deformation),speed cannot be controlled when a threshold-triggered deformation(observed at the trip of a switch dome) advances a deformed portion ofthe dome in such positive direction at a speed that is greater than thatof the part of the force deliverer (e.g., a force deliverer tip) thatapplies the deformation force). When such trip related concern does notapply, there nonetheless exist non-constant speeds at the beginning andend of a cycle (of course, speed must increase and decrease from and tozero at such travel portions); where motion is constant after suchacceleration and terminal deceleration, the speed is said to be constant(or meet some other intended (and perhaps user-input) constraint.

A constant deformation speed constraint may be preferred over a constantacceleration or other constraints because a constant speed constraintavoids error that may be introduced by accelerative or inertial effectsthat may be associated with such other constraints. It is also of notethat deformation force deliverer position extrema constraints may beused to demarcate the endpoints of the travel of the test object duringdeformation.

In preferred embodiments, the step of adjusting a deformation forcedeliverer affecting input may comprise the step of adjusting anelectrical input, which itself may comprise the step of adjusting acurrent; as is well known, one way in which current may be adjusted isby adjusting a voltage. In such embodiments, and, indeed, in others, thestep of adjusting a deformation force deliverer affecting input maycomprise the step of using a linear encoder 12 and a servo controller 11(e.g., as in certain deformation motion constraint embodiments) or thestep of using recorded calibration data 58 and a servo controller 11(e.g., as in certain deformation force constraint embodiments). Also, inpreferred embodiments, the step of adjusting a deformation forcedeliverer affecting input is repeated automatically (i.e., the step ofadjusting a deformation force deliverer affecting input is automaticallyadjusting). Of course, such may occur many times per second; the moreoften the feedback is received and adjustments are made, the moreaccurate and representative the results.

In particular embodiments, the step of adjusting a deformation forcedeliverer affecting input so as to meet at least one constraint maycomprise the step of adjusting a deformation force deliverer affectinginput so as to meet a deformation force constraint (e.g., a constantdeformation force). In such embodiments, one particular control schememay control force deliverer motion with additional deformation forcedeliverer position extrema constraints. In such embodiments, the step ofadjusting the deformation force deliverer affecting input may comprisethe step of reading recorded calibration data and using aservo-controller 11. More specifically, the calibration data, which mayrelate current to force and to position, may be used to determine whichcurrent is needed to generate the desired deformation force (e.g., thedesired constant force) at a specific position; the servo-controller 11may then simply adjust current to that amount. In deformation forceconstraint embodiments, the step of determining test object response maycomprise the step of using a linear encoder 12. Simply, the linearencoder 12 may be used to measure speed at individual deformationpositions. As such, the step of determining test object response maycomprise the step of determining deformation speed as it relates todeformation position.

When the step of determining test object response comprises the step ofdetermining the deformation force, the step of adjusting a deformationforce deliverer affecting input so as to meet at least one constraintmay comprise the step of using a linear encoder 12 and a servocontroller 11 to apply the proper amount of current necessary to movethe deformation force deliverer at a constant speed or acceleration.Further, the step of determining deformation force (e.g., deformationforce vs. deformation position) may comprise the step of generatingadjusted deformation force dependent input values (e.g., adjustedcurrents), and reading recorded calibration data based on such values(e.g., reading which force is associated with a specific current appliedwhile the test object is deformed at a certain position). Again, whendetermining test object response comprises the step of determining thedeformation force, determining test object response may comprise thestep of determining deformation force as it relates to deformationposition; force versus test object deformation data (displacement ortravel data) may be presented, whether graphically or otherwise.

When the step of determining test object response comprises the step ofdetermining deformation speed, the step of adjusting a deformation forcedeliverer affecting input so as to meet at least one constraint maycomprise the step of using calibration data to determine currentnecessary to deliver a specific constant force at force delivererpositions. As mentioned, such may involve the use of recordedcalibration data and a servo-controller 11. Further, the step ofdetermining deformation speed may comprise the step of using a linearencoder 12 to generate speed vs. deformation position data, and the stepof determining deformation speed (again, which may be identical todeformation force deliverer speed) may comprise the step of generatingadjusted deformation force dependent input values (e.g., adjustedcurrents necessary to keep the force at the desired level). Of course,deformation speed versus test object deformation data may be presented,whether graphically or otherwise.

In particular embodiments, the step of moving a deformation forcedeliverer to deliver deformation force to a test object 3 may comprisethe step of delivering current to a linear actuator 15 (such as a linearvoice coil actuator, whether it have moving voice coil 16 or movingpermanent magnet). Alternatives to a linear actuator include but are notlimited to: electrostatic speaker type diaphragm and plate system, andplanar magnetic speaker type systems.

Certain embodiments may further comprise the step of moving a forcedeliverer drive component 75 (i.e., a moving component that, at least insignificant part, supplies the drive force; e.g., if a voice coil linearactuator is used, moving voice coil or moving permanent magnet,depending on the type of voice coil linear actuator used) at a firstspeed and a first acceleration (at a certain point in time) whiledelivering a drive force 21 to the deformation force deliverer, whereinthe step of moving the deformation force deliverer comprises the step ofmoving the deformation force deliverer at the first speed and firstacceleration and simultaneously with the step of moving the forcedeliverer drive component 75 (e.g., linear actuator drive component 79).It is of note that embodiments are in stark contrast to prior art, loadcell, or strain gage based systems (see, e.g., FIG. 2), where the drivecomponent and the force deliverer do not move simultaneously at the samespeed and acceleration; indeed, the differences of such parameters insuch prior art devices stem from the basic theory behind suchdevices—intentional, and often enhanced, deformation of an component (acantilever 30) established between the drive component and thedeformation force deliverer. In the inventive technology, the forcedeliverer drive component may be, but is certainly not limited to, amoving linear actuator component such as the voice coil or permanentmagnet, depending on whether the voice coil moves or the permanentmagnet moves. As the name implies, the deformation force deliverer drivecomponent moves and thereby drives the deformation force deliverer.

Of course, and as mentioned above, the inventive methods may findvarious application. In certain applications, the step of moving adeformation force deliverer to deliver deformation force to a testobject may comprise the step of moving the deformation force delivererto deliver deformation force to a force activated switch dome. Also, thestep of determining test object response to the deformation force maycomprise the step of determining hardness and the step of determiningtest object response to the deformation force may comprise the step ofdetermining elasticity. Hardness testing in particular may involve theextent of deformation in response to a quickly applied sufficientlylarge load.

Certain embodiments relate to cyclical failure response of the testobject, where the step of determining test object response may comprisethe step of determining a cyclical failure response of the test object;such embodiments may further comprise the step of repeating the steps ofmoving, adjusting and deforming as such steps are further describedabove. Such embodiments may further comprise the step of generating testobject performance parameter (trip force and/or electrical resistance,as but two examples) versus cycles response data. Often, but by no meansalways, the test object is a force activated switch dome 25. Switchdomes (tactile domes) are classic examples of items tested for cyclicalfailure. They are also extensively tested for other parameters (asmentioned above), including but not limited to: deformation force vs.position, maximum force, trip force, tactile ratio and electricalresistance (to determine whether the contacts are effectively made andthe switch has closed or not), as but a few examples.

The inventive technology may include inventive apparatus that, incertain ways, correlate with the above-described inventive methods.Accordingly, embodiments of the inventive technology may relate to anapparatus for determining test object deformation response, comprising adeformation force deliverer 1 that delivers deformation force 24 to atest object 3; an input adjuster 30 (e.g., a current adjuster) thatadjusts an input (to, e.g., a linear actuator) that affects motion ofthe deformation force deliverer so as to meet at least one constraint; adeformation force deliverer drive that drives said deformation forcedeliverer; and a test object response determiner 31 (e.g., a computercomponent) that determines test object response to the deformationforce.

In particular embodiments of such inventive apparatus, the at least oneconstraint may comprise at least one deformation force deliverer motionconstraint (e.g., a constant speed constraint, a constant accelerationconstraint, and/or deformation force deliverer position extremaconstraints). Test object response may be deformation force as itrelates to deformation position (e.g., a plurality of force vs.deformation data, one piece of which could, e.g., be 23 grams of mass at0.41 mm of deformation of the test object). Indeed, mass may be used asan indicator of force. In such embodiments, the input adjuster 30 maycomprise a linear encoder 12 and a servo-controller 11, and/or testobject response determiner 31 that itself may comprise recordedcalibrated data 58 and a reader 59 able to read such data. Computationalprotocols used to generate the desired output may be as described above.

In certain embodiments, the at least one constraint may comprise atleast one deformation force constraint, and the test object response maycomprise deformation speed as it relates to deformation position. Insuch embodiments, the input adjuster may comprise recorded calibrationdata 58 and a servo-controller 11 (often the servo-controller itself isable to read such data), and the test object determiner 31 may comprisea linear encoder 12 (which could determine speed of the deformationforce deliverer and thus, in embodiments without, e.g., a rubber tip,deformation speed). Computational protocols used to generate the desiredoutput may be as described above.

When the input adjuster 30 comprises a servo-controller 11 and a linearencoder 12 (and, indeed, even in other designs), the test objectresponse may comprise deformation force versus position (displacement ortravel), and the at least one constraint may comprise a constant speedconstraint, a constant acceleration constraint, and/or deformation forcedeliverer position extrema constraints (which correspond to, e.g., thedeformed and maximally deformed positions of the test object). In suchdesigns, in particular, the test object response determiner 31 maycomprise recorded calibration data. Of course, whenever a componentcomprises recorded calibration data, there may be also provided a readerto read and perhaps output such data.

When the input adjuster 30 comprises a servo-controller 11 and recordedcalibrated calibration data (and, indeed, even in other designs), testobject response may comprise deformation speed (displacement speed, ortravel speed) versus position. Often in such embodiments, the at leastone constraint includes a constant force constraint and the test objectresponse determiner comprises a linear encoder. Computational protocolsused to generate the desired output may be as described above.

In particular embodiments, the deformation force deliverer drive 20 is alinear actuator 15, such as a voice coil linear actuator (again,including moving voice coil and moving permanent magnet types of voicecoil linear actuators). Particular embodiments may further comprise adeformation force deliverer drive component 75 (e.g., a moving voicecoil of a moving voice coil type linear actuator) that moves at a firstspeed and a first acceleration (a certain points in time), and, in suchembodiments, the deformation force deliverer moves at the first speedand the first acceleration simultaneously with the deformation forcedeliverer drive component. As explained above, this is in stark contrastto prior art strain gauge designs.

In these, and other embodiments, the test object 3 may comprise a forceactivated switch dome 25 (as but one of many examples), and test objectresponse may comprise a hardness related response, an elasticityresponse, and/or cyclical failure response (as but a few examples).Often, when test object response comprises cyclical failure response,the deformation force deliverer repeatedly delivers the deformationforce 24 to the test object 3 to determine cyclical failure response.

Another aspect of the inventive technology may be described as a methodfor determining test object deformation response and may comprise thesteps of: moving a force deliverer drive component 75 at a first speedand a first acceleration while delivering a drive force 21 to adeformation force deliverer 1; simultaneously moving the deformationforce deliverer at the first speed and the first acceleration; deforminga test object 3 with a deformation force 24 delivered by the deformationforce deliverer 1 while performing the step of simultaneously moving thedeformation force deliverer at the first speed and the firstacceleration; and determining test object response to the deformationforce 24.

Particular embodiments of such inventive technology may further comprisethe step of adjusting a deformation force deliverer affecting input soas to meet at least one constraint, whose particular aspects may be asdescribed elsewhere in this specification (e.g., such constraintsinclude but are not limited to test object deformation motionconstraints such as constant speed or acceleration or deformation forceconstraints such as constant deformation force).

In particular closed loop system embodiments, the step of moving a forcedeliverer drive component 75 may comprise the step of powering the forcedeliverer drive 20 with a varying current; in such embodiments, currentmay be adjusted to meet a deformation force deliverer motion constraint.As such, these closed loop embodiments may be said to rely on feedback,where the feedback may be information provided by a linear encoder 12relative to deformation speed, acceleration or position of the testobject, which the servo-controller 11 can then act on so as to meet thedeformation speed, acceleration or position and/or position constraint.

Certain embodiments may be more accurately described as open loopsystems in that they may not rely on feedback as in the afore-describedclosed loop systems. In one example of such a system, the step of movinga force deliverer drive component 75 comprises the step of powering theforce deliverer drive 20 with a constant current. In open loop systemsin particular, the step of determining test object response may not onlycomprise the step of determining deformation force vs. deformationposition, but the step of determining test object response may comprisethe step of determining deformation speed vs. deformation position. Ofcourse, in any system where deformation speed is not constrained (e.g.,not caused to be constant), deformation speed vs. deformation positionmay provide valuable test object response information. Computationalprotocols in open loop, constant current systems may simply measureforce using a linear encoder 12 (to generate deformation position data)and calibration tables to use that position data to read (perhaps whileinterpolating) force associated with a given current and position.Additionally, the linear encoder 12 may be useful to provide speed vs.position data.

Regardless of whether the method is closed or open loop, the step ofmoving a force deliverer drive component 75 may comprise the step ofdelivering current to a linear actuator 12. Further, the step ofdeforming a test object 3 may comprise the step of deforming a forceactivated switch dome 25, the step of determining test object responseto deformation force may comprise the step of determining hardness,determining elasticity, and/or determining a cyclical response. When themethod relates to determining cyclical response (e.g., cyclical failureresponse), the method may further comprise the step of repeating thesteps of moving a force deliverer drive component 75, simultaneouslymoving the deformation force deliverer 1, and deforming a test objectwith a deformation force. In such embodiments, the method may furthercomprise the step of generating test object performance parameter versuscycles response data (e.g., the maximum force, and/or the electricalresistance at 1, 100, 100, 1,000, 10,000, 100,000 cycles, perhaps untilfailure). Of course, data relative to the number of “pass/fails”relative to meeting a certain parameter in a given number of cycles maybe generated. Whether the test object 3 is a force activated switch dome25 or something else, the test object performance parameter may comprisetrip force and/or an electrical resistance, as but two examples. Ofcourse, electrical resistance may be used to indicate whether a switchhas closed or not; a substantially infinite resistance (or, at least,very high) may be associated with an open switch while a resistancereading of less than a certain amount (e.g., less than a certain ohmage)indicates closing of a switch. The apparatus may provide information,e.g., relative to the number of successful switch closings or purelyelastic deformations (e.g., no plastic deformation, which may signifyfailure), observed over a certain number of cycles.

An aspect of the inventive technology related to that method describeddirectly above may be described as an apparatus for determining testobject deformation response and may comprise: a force deliverer drivecomponent 75 that moves at a first speed and a first acceleration whiledelivering a drive force 21; a deformation force deliverer 1 to whichthe drive force 21 is delivered and that moves at the first speed andthe first acceleration to deliver deformation force to a test object 3;and a test object response determiner 31 that determines a response of atest object to the deformation force, wherein the deformation forcedeliverer is capable of delivering a deformation force to the testobject, and wherein the deformation force deliverer moves simultaneouslywith the force deliverer drive component 75.

The apparatus may further comprise an input adjuster 30 that adjusts aninput that affects motion of the deformation force deliverer so as tomeet at least one constraint. In those embodiments where the test objectresponse determiner is capable of determining deformation force vs.deformation position, the at least one constraint may comprise a testobject deformation speed and/or acceleration constraint, and, perhapsalso the aforementioned position extrema constraints. Further, in suchembodiments, the input adjuster may comprise a servo-controller 11 and alinear encoder 12, while the test object response determiner 31 maycomprise recorded calibration data, and a computer component capable ofreading such data. In those embodiments where the test object responsedeterminer is capable of determining speed vs. deformation position, theat least one constraint may comprise a test object deformation forceconstraint. Further, in such force constraint embodiments, the inputadjuster may comprise recorded calibration data and a servo-controller11, and the test object response determiner may comprise a linearencoder 12.

As with other aspects of the inventive technology, particularembodiments of this apparatus may be described as closed or open loop.In closed loop systems, the force deliverer drive 20 may be powered witha varying current (albeit one varied in a controlled fashion, as wherecurrent is varied to meet a deformation force deliverer speed constraintor deformation force constraint) while moving at a first speed and afirst acceleration while delivering the drive force; the test objectresponse determiner 31 may determine deformation force vs. deformationposition, and/or the test object response determiner may determinedeformation speed vs. deformation position.

In what may more accurately be described as an open loop apparatus, theforce deliverer drive component 75 may be powered with a constantcurrent while moving at a first speed and a first acceleration whiledelivering the drive force. In such embodiments (and, indeed, inothers), the test object response determiner 31 may determinedeformation force vs. deformation position and/or the test objectresponse determiner may determine deformation speed vs. deformationposition.

Regardless of whether the inventive apparatus is closed or open loop,the deformation force deliverer drive component 75 may comprise a linearactuator component 79 (again, such as a moving voice coil or a movingpermanent magnet); the linear actuator may be a voice coil linearactuator (e.g., a moving voice coil linear actuator or a movingpermanent magnet voice coil linear actuator). As with other aspects ofthe inventive technology, applications are varied; the test object may 3be a force activated switch dome 25 (as but one example of many possibletest objects), and test object response includes but is not limited tohardness-related response, elasticity response, and cyclical response,such as cyclical failure response. In those embodiments used forcyclical failure testing, the deformation force deliverer may repeatedlydelivers the deformation force 24 to the test object 3 to determinecyclical failure response.

Particular aspects of the inventive technology are linear actuatorlimited. As such, a method for determining test object deformationresponse may comprise the steps of: delivering current to a linearactuator 15; moving a deformation force deliverer to deliver deformationforce to a test object while performing the step of delivering current;deforming the test object 3 with the deformation force 24; anddetermining test object response to the deformation force.

Such aspects may further comprise the step of adjusting a deformationforce deliverer affecting input (e.g., current applied to a linearactuator) so as to meet at least one constraint (deformation forcedeliverer motion constraint such as a test object deformation speedconstraint or a test object deformation acceleration constraint, or, onthe other hand, a deformation force constraint). Particularly when theconstraint is a deformation force deliverer motion constraint, the stepof determining test object response may comprise the step of determiningdeformation force vs. deformation position. Further, in such embodiment,the step of adjusting the deformation force deliverer affecting inputmay comprise the step of adjusting the current. Indeed, embodiments withconstraints (which may be referred to as closed loop embodiments), thestep of delivering current to the linear actuator may comprise the stepof delivering varying current to the linear actuator. When theconstraint is a deformation force constraint, the step of determiningtest object response may comprise the step of determining deformationspeed vs. deformation position. In aspects of the inventive technologythat do not include such constraints, and thus which may be moreaccurately be described as open loop, the step of delivering current tothe linear actuator may comprise the step of delivering constant currentto the linear actuator. In open loop systems, not only might it behelpful to determine force vs. position, but what might also berevealing is deformation speed vs. deformation position data. Of course,as mentioned, deformation speed vs. deformation position data may alsobe revealing in closed loop embodiments that have a force constraint(e.g., a constant force).

Particular embodiments may further comprise the step of moving a linearactuator drive component 79 (a moving voice coil or a moving permanentmagnet, as but two examples) at a first speed and a first accelerationwhile delivering a drive force 21 to the deformation force deliverer 1;in such embodiments, the step of moving the deformation force deliverer1 may comprise the step of moving the deformation force deliverer at thefirst speed and first acceleration and simultaneously with the step ofmoving the linear actuator drive component 79.

As mentioned, applications of this technology are varied. As such, thestep of deforming the test object may comprise the step of deforming aforce activated switch dome 25 (as but one example of many possible testobjects). The step of determining test object response to thedeformation force may comprise the step of determining hardness, thestep of determining test object response to the deformation force maycomprise the step of determining elasticity; and/or the step ofdetermining test object response to the deformation force may comprisethe step of determining a cyclical response (e.g., cyclical failureresponse). In those embodiments directed at life cycle response testing(whether failure related or otherwise), the inventive methods mayfurther comprise the step of repeating the steps of moving thedeformation force deliverer, and deforming a test object. In suchembodiments, the step of determining test object response may comprisethe step of determining a cyclical failure response of the test object(e.g., a force activated switch dome), and the method may furthercomprise the step of generating test object performance parameter versuscycles response data (e.g., trip force or an electrical resistance).

Apparatus corollary to the above-described inventive method technologymay be described as an apparatus for determining test object deformationresponse and may comprise a linear actuator 15 that moves a deformationforce deliverer 1 that delivers deformation force 24 to a test object 3;and a test object response determiner 31 that determines a response ofthe test object 3 to the deformation force 24.

Particular embodiments may further include an input adjuster 30 thatadjusts an input that affects motion of the deformation force delivererso as to meet at least one constraint. In such embodiments (which may bedescribed as closed loop embodiments), the test object responsedeterminer may be capable of determining deformation force vs.deformation position (particularly in those embodiments with at leastone deformation force deliverer motion constraint). In such embodiments,constraints may include but are not necessarily limited to a test objectdeformation speed constraint and/or a test object deformationacceleration constraint. In such embodiments, the input adjuster 30 maycomprise a linear encoder 12 and a servo-controller 11.

In closed loop embodiments where the test object response determiner 31is capable of determining speed vs. deformation position (which may befound when the constraint is a deformation force constraint), the inputadjuster 30 may include a servo-controller 11 and recorded calibrationdata (and perhaps a computer component capable of reading such data ifthe servo-controller itself does not include such reading capability).In those embodiments where test object response determiner 31 is capableof determining speed vs. deformation position, the test object responsedeterminer may include a linear encoder 12.

In closed loop systems, the linear actuator 15 may be powered with avarying current while delivering a deformation force. In open loopsystems, the linear actuator may be powered with a constant currentwhile delivering a deformation force. In either such embodiments, thetest object response determiner 31 may determine deformation force vs.deformation position and/or deformation speed vs. deformation position.As mentioned, a typical closed loop system designed to generatedeformation speed vs. deformation position data will operate under aconstant force constraint while a typical closed loop system designed togenerate deformation force vs. deformation position data will operateunder a constant deformation speed (or acceleration) constraint; ineither, current input may be adjusted to meet such constraints. Atypical open loop system will operate under a constant currentconstraint (e.g., a constant current fed to a linear actuator) and mayuse a linear encoder 12 to generate deformation speed vs. deformationposition data, or a linear encoder 12 and calibration data 58 togenerate deformation force vs. deformation position data (of course, thedeformation force may be read using measured deformation speed andposition data).

As in other aspects of the inventive technology, a drive component 75(moving voice coil, e.g., if a linear actuator 15 is used) may move at afirst speed and a first acceleration, and the deformation forcedeliverer 1 may move at the first speed and the first accelerationsimultaneously with the drive component. Regardless, the applicationsare, as with other aspects of the inventive technology, quite varied.The test object may be, but is certainly not limited to, a forceactivated switch dome 25, and test object response may be a hardnessrelated response, an elasticity response, and/or a cyclical response(e.g., a cyclical failure response). Particularly where the response tobe determined is a cyclical response, the deformation force deliverermay repeatedly deliver the deformation force to the test object todetermine cyclical failure response.

It is of note that, for each of the inventive aspects, componentry maybe configured/housed in a variety of manners. One is a test station 80(e.g., a Tru-Tac™ test station) that includes an interface 81 (in whichmay be housed, e.g., a linear actuator and linear encoder) from whichmay extend a deformation force deliverer 1, support arm 82 for theinterface, base plate 83 above a base 84 in which may be housed aservo-controller and other electrical componentry, test object blocklocator 85 adapted for securement on the base plate, and a power supply86. Of course, this is merely one of many different ways of configuringthe inventive apparatus. Associated electrical/computer parts that mayenable co-functionality of electrical componentry as intended mayinclude, but is certainly not limited to a motherboard, data acquisitioncard. amplifiers, resistors, shunt resistors to assist in monitoringcurrent (to, e.g., a voice coil), jacks, switches, RAM, etc., as wouldbe readily understood from one of ordinary skill in the art uponreviewing the supplied electrical diagrams. Of course, anyspecifications/dimensions/product models, etc. shown in the figures orotherwise described in this application are merely exemplary and do notin any fashion limit the scope of the inventive technology.

Aspects of the inventive technology may include CPU and other hardware,and software, necessary to render the unit entirely controllable viacomputer. Software, whether in C++, Java, or other, may facilitateuser-control and operation of the tester via. A webserver may allowcoordination of the unit with the internet, thereby allowing enhancingfunctionality, communication and manipulation of results, in addition tocoordination of separate units in desired fashion. Computer control ofthe test may allow for comprehensive control of testing protocol,including the ability to test to provide results that accord withanticipated use of the object, or for other reasons. For example, asimple testing protocol enabled by the enhanced computerized controlexhibited by the inventive technology is, as but one of countlessexamples, test for force vs. displacement, test for electricalperformance, cycle 5,000 times, test for force vs. displacement, testfor electrical performance, cycle 10,000 times, test for force vs.displacement, test for electrical performance, cycle 1,000 times, etc.

In particular embodiments, a focus of the inventive technology mayindeed be on the use of a voice coil in combination with a linearencoder and controller to provide positional, speed and/or accelerationinformation about linear motion of a deformation force deliverer such asa linear actuator shaft (generally, a servo-motion based technique). Itshould be understood that whenever a voice coil is used to drive adeformation force deliverer in a linear manner, such is considered avoice coil linear actuator. It should also be understood, for purposesof clarity, that explanations of, e.g., specific terms, that appear inthis disclosure typically apply to all uses of such terms.

Additional disclosure relative to use of embodiments of the inventivetechnology may be as follows (of course, detailed specification,including but not limited to dimensions, below and in other parts of theapplication, are merely exemplary). Reference to TruTac™, in addition toany descriptive text appearing below (other than the claims), is merelyexplanatory relative to this specific test station; it shall not limitthe scope of the claims in any manner.

Overview of the TruTac™ Force Displacement Test Station:

The TruTac™ force displacement test station is capable of accurate,repeatable force tests on various types of switches and switchassemblies. It is a stand alone unit that tests and displays measurementreadings to the user via its incorporated LCD panel, or in tandem with aPC. Single or multiple TruTac test stations can also be integrated witha company network so data can be programmed, viewed, and downloadedremotely. The TruTac can be used to test metal domes, poly domes,membrane switches, and most other switches, depending on testerconfiguration. It may be the first tester to comply with ASTM standards,and tests include trip force, return force, standing free height,displacement (travel), tactile ratio, tactile slope, and switchresistance. The TruTac™ can also test the life of a switch and beprogrammed to conduct intermittent tests for mechanical and electricalfailures. Life testing speeds of 20 actuations per second are possibledepending on switch travel.

Features

-   -   First switch test unit to conform to new ASTM 2592 standard    -   Tests trip force, return force, free height, displacement,        tactile ratio, tactile slope, resistance, life, and more    -   Compact design    -   Built in LCD with intuitive displays    -   PC and network compatible    -   Fast and accurate tests    -   Pre-drilled and threaded testing platform for custom tooling        plate configurations    -   Custom features available        Set Up

The TruTac test station comes complete with the base, support arm, andinterface screen preassembled. A power supply, power cord, andapplicator tips are also included.

Set-up

-   1. The TruTac test station will arrive packaged in a box with foam    padding to protect it during shipping. Upon receiving your TruTac    unit, remove the TruTac box from the shipping box. Open the top of    the TruTac box and remove the foam packaging to reveal the test    station. Carefully remove the top of the foam padding so that the    TruTac test station is visible. Gently remove the TruTac while    holding the interface stand (Exhibit D) and place it on a solid    surface. The power supply (Exhibit E), power cord (Exhibit L), and    bag containing both actuator tips (Exhibit C) are located under the    TruTac unit.

Note: Hold the unit by the silver stand when handling the TruTac teststation. Never hold the TruTac test station by the interface controlbox.

-   2. The test unit will operate best if placed on a solid table that    is free from vibrations. Avoid placing any part of the system closer    than necessary to sources of electrical or magnetic disturbance such    as computer monitors, speakers or fluorescent lights.-   3. Connect the AC power cord from the power supply into a wall    socket or power strip. Connect the DC power cable from the power    supply to the unit.-   4. Turn the power switch to the “on” position. Allow 2 minutes for    the system to boot-up.    PC Access

In certain models the TruTac can be used in conjunction with a PC viaEthernet connection to get detailed test information and reports.Graphical User Interface (GUI) software comes pre-installed on theTruTac test station, and runs on the user's web browser using Javatechnology. Since the software is web browser based, data can beprogrammed, viewed, or downloaded remotely from any computer which hasauthorized access to your company network.

To access software screens on a PC, you may connect an Ethernet cable tothe back of the TruTac test station. Open your web browser (e.g. Google,MSN, Yahoo, etc.) and type the name of the test station (or IP address)in the navigation bar. The TruTac test station is designed toautomatically acknowledge your network IP address once connected.

Note: The test station name and IP address can typically be found on theTruTac test station by scrolling to About on the main screen andpressing Enter.

Note: The TruTac typically comes pre installed with Java Runtime version1.6. It will automatically try to determine if you have a compatibleJava Runetime version already installed on your PC. If not, it willdirect you to a link with information on how to download the appropriateJava version.

Note: The TruTac test station typically can be connected to a standalone PC using a cross over Ethernet cable.

Note: Some networks may have security measures that will block automaticlogin. Contact your IT Network administrator if the network is notautomatically acknowledged.

In certain models a warning message that reads “The application'sdigitial signature cannot be verified. Do you want to run theapplication?” may be displayed when first logging in to the graphicinterface software. Select Run to grant permission to access yournetwork.

Note: The TruTac test station may be compatible with Internet Explorerversions 6.0 and 7.0, Firefox, and Opera. Use Java Runetime Engine v1.5or v1.6.

Note: A copy of Java software (which can be downloaded to your PC) andthe TruTac user's manual may be contained on the CD that come with theTruTac test station.

User Interface

In certain models the user interface on the TruTac test unit may includean LED interface display screen, and five keys (Up, Down, Back, and twoEnter buttons).

Depending on the test being performed, the LED display screen maydisplay commands at the bottom of the screen to help the user navigateto the appropriate area.

Main Screen

In certain models the stand alone inspection mode may allow the user toget test data directly from the user interface screen of the TruTac teststation. Test data may include Fmax, Fmin, height, travel andresistance.

Note: To get accurate results, the actuator tip should actuate directlyin the center of the switch.

The default screen on the user interface may have the following options:

-   Force Displacement Test-   Height Test-   Locate Plate-   View Results-   Settings-   About    Force Displacement Test

In certain models to conduct a force displacement test, scroll to ForceDisplacement Test on the main screen and press the Enter key.

Line up the center of the switch with the actuator tip by either 1)pulling down on the actuator, or 2) using the Jog Down key command,until the actuator is positioned in the center. Return the actuator toits original position.

Once the switch is centered properly, select the Enter key to conductthe test.

Note: You may wish to pre-actuate your switch prior to conducting atest. See Settings (page 16, 17) for settings information.

Once you select Enter, a message will appear on the LED display screenindicating that the “Test is running . . . ”. Once the test is complete,the screen will list results for:

-   Fmax-   Fmin-   Height-   Travel-   Final Resistance

Select the Enter key to switch back and forth between the View Graph andview text screens. Select the Back key to return to the main menu.

The bottom of the screen gives you the options to go Back or View Graph.The Back key will bring you to the main screen. The Enter key will allowyou to view a force displacement curve showing Forward Force,Resistance, and Reverse Force.

Height Test

In certain models to conduct a free height test, scroll down to HeightTest on the main screen and press the Enter key.

Line up the center of the switch to be tested with the actuator tip byeither 1) pulling down on the actuator, or 2) using the Jog Down keycommand, until the actuator is positioned in the center. Return theactuator to its original position.

Once the switch is centered properly, select the Enter key to conductthe test.

A data screen will appear with the free height of the switch beingtested. Press the Back button to return to the main screen.

Note: Prior to conducting the first test, it is advised to locate thetesting plate in order to get the zero position. See Locate Plate (page8) for to see procedures for locating the test plate.

Locate Plate

Prior to conducting the first test, it is advised to locate the testingplate in order to get the zero position. This test will record theposition of the plate which is necessary to get accurate measurementreadings.

In certain models to locate the testing plate from the main screen, usethe down arrow key to scroll to Locate Plate and press the Enter key. Amessage reading “Locating plate” will display on the screen while theactuator finds the zero position. Once that position is recorded, themain screen will reappear and you can proceed with testing.

Note: The Locate Plate function must be run if the testing plate heighthas changed to provide a new zero reference for measurement. The valueof the last Locate Plate function will remain valid even if the TruTactest station is powered off.

Warning: In certain models do not test directly on the testing platformas it may cause damage to the surface. Always use a testing fixtureplate.

View Results

In certain models the view the results of the most recent test run,scroll on the main screen to the View Results and press the Enter key.

A data screen will appear that lists the following results of the mostrecent test:

-   Date-   Time-   Fmax-   Fmin-   Free Height-   Travel-   Resistance    Settings

In certain models the settings screen allows adjustment to:

-   Pre-actuations-   Contact threshold-   Enable/disable reverse curve-   Force level

To view the settings screen, scroll down to Settings on the main screenand press the Enter key.

The following commands will be listed at the bottom of the settingsscreen.

-   Main (returns to the main screen)-   Scroll Up-   Scroll Down-   Edit (allows you to adjust settings)

To adjust a setting, use the Scroll Up or Scroll Down keys to a desiredsetting and select the Enter key. Adjust the setting by using the up ordown keys. Once the desired setting is reached, select the Enter key.

The following are the adjustment ranges:

-   Pre-actuations: 0-100 actuations-   (actuates the switch before running the test)-   Contact threshold*: 1-1,000 Ohms-   (threshold used to determine when contact has been made during the    actuation of a switch)-   Enable/disable reverse curve: Yes/No-   (determines whether a reverse curve test is executed or not)

Once you have entered your desired settings, select the Back key toreturn to the main menu

* Contact threshold is used to calculate ASTM values of contact force(Fc), break force (Fb), travel contact (Tc), and travel break (Tb)

About

In certain models the about screen displays general information aboutthe test unit. To view the about screen, scroll down to About on themain screeen and press the Enter key.

In addition to general Snaptron, Inc. Information, the following isdisplayed on the About screen;

-   Software version number-   Hardware version number-   Network name-   Network IP Address

Select the Back key to return to the main menu.

Connecting

In certain models the TruTac test station may be pre-programmed so nospecial software installation is required. The TruTac test stationsoftware screens are displayed via your web browser. Once you haveaccessed the graphic interface screen on your PC, the user can run testsand view data remotely.

Note: Please see PC Access (on page 7) for information on connecting tothe PC graphic interface screen.

There are four PC graphic interface tabs:

-   1. Force Test tab-   2. Locate Devices tab-   3. Life Test tab-   4. Tools/Settings tab    Force Test

In certain models the graphic interface screen will default to the ForceTest tab. On this tab, a force curve is generated mapping datapertaining to force measured in grams), travel (measured inthousandths), and resistance (meausured in Ohms).

In the Force Test tab the user can execute a force test and view theresults—including Fmax, Fmin, travel, height, and resistance. The userhas the option to run and view the results of a test, and to save allthe raw test data to a comma separated file (.csv). Prior to running atest, conduct the Locate Plate function (page 14) on the TruTac teststation. Once the zero position has been determined, place the center ofa switch directly under the actuator. Select the Run Test button on thePC screen to initiate the test and view the results.

There are three icons at the top of the Force Test tab:

-   1. Save test data to file (left)-   2. Generate test report (middle)-   3. View user manual (right)    Save Test Data to File

In certain models after completing a test, selecting this icon will saveraw test data to the location you select in an .csv format. Columns thatrepresent the raw data are 1) position (th), 2) force (g), and 3)resistance (Ohms).

Generate Test Report

In certain models this function takes HTML report information andconverts it into PDF format. The report can then be printed, attached toan existing document, emailed, etc. The standard report lists ASTMstandards, including Fmax, Tfmax, Fmin, Tfmin, Fc/Fb, Tc/Tb, teaseforce, tease travel, free height, travel, tactile response slope,tactile recovery slope, tactile ratio, resistance threshold, andresistance (end of test). The standard report also includes the forcedisplacement curve and an area to add notes. Reports for the most recenttest conducted is automatically saved on the TruTac unit. In addition tothe standard report, custom reports can also be added. SeeTools/Settings (page 23) for information on creating custom reports.

View User Manual

This opens a PDF of the TruTac user manual.

Locate Device Tab

In certain models the Locate Device tab is for users who have multipleTruTac test stations on their network and are wanting to locate aspecific unit or units. Selecting the Search button will send out anetwork broadcast and all TruTac test stations that are on the network(and turned on) will automatically reply back.

All connected TruTacs will be populated on the list menu. A single clickon a device name will display the general information, including currentsoftware revision, model number and serial number of the unit. A doubleclick on the device name will open a new window in the user's webbrowser, load the software screen of that device, and establish aconnection with that device.

Life Test Tab

In certain models the Life Test tab shows data (number of cycles andforce readings) of the current or most recent life test. The user canalso set and adjust parameters for life testing, including the number ofcycles to run, intermittent and final force readings, and the force inwhich a switch is life tested (ranges measured in grams). The progressof a life test is displayed on the screen.

Note: The options for the force levels on the Life Test tab controls theforce during life cycle testing AND force readings. When a life test isbeing conducted, the force range selected overrides the settings forforce testing selected in the Tools/Settings tab.

In certain models, there are two options for testing the life of aswitch:

Option #1

The user enters the total number of cycles, at what intervals to conducta force test, and the force level at which to run the force tests.

In certain models the user then selects the Start button on the PCscreen and historical data is recorded on the graph.

Option #2

In certain models the user can create a test script file using a simpleset of commands and upload this to the TruTac test station. To do this,select the Use Recipe File followed by selecting the Load Recipe button.This will upload the command codes from a text file.

Commands may be as follows:

-   doforcetest—Conducts a force test-   cycle XX—Conducts life tests whereas “XX” is the number of cycles

An example of a test script is shown below:

-   doforcetest-   doforcetest-   doforcetest-   doforcetest-   cycle 10-   doforcetest-   cycle 20-   doforcetest

Upon executing the test script, the TruTac will do the following:

-   4 force tests-   Cycle the switch 10 times-   1 force test-   Cycle the switch 20 times-   1 force test-   Test complete

In certain models the user has the option to save the test data to acomma seperated file (.csv) that includes a timestamp, force readings,and resistance readings. To save the data, select the icon at the top ofthe PC screen.

The bottom of the PC screen shows both the Cycle Count and ActuationCount. The cycle count indicates the amount of times each dome isactuated, while the actuation count shows the amount of electricalactuations (circuit being completed) being achieved.

Note: The user has the option to connect the switch under the testresistance connection.

Note: The cycle rate can be adjusted to approximately 20 cycles persecond, depending on the travel of the switch being tested.

Tools/Settings Tab

In certain models there are five categories in the Tools/Settings tab;force test parameters, test reports, network, software update, andprocess control mode.

Category 1: Force Test Parameters

Contact Threshold: Refers to the resistance measurement on a switch andis measured in Ohms. When resistance falls between the set levels, it isconsidered an actuation.

Pre-Actuations: Refers to the number of actuations conducted prior tothe force reading test. Pre-actuations are suggested to stabilize theswitch prior to the force reading. The range for pre-actuations is 0 to100.

Force Level: Refers to the amount of force used to actuate the dome toconduct a force test. Feedback may be used to assure compliance withrange limits. Ranges include, but are not necessarily limited to:

-   0 g to 300 g-   300 g to 600 g-   600 g to 900g

Reverse Curve: Refers to the presence of a reverse curve on the forcetest. When the reverse curve box on the PC screen is checked, thereverse curve is enabled. When the box is unchecked, the curve isdisabled.

Category 2: Test Report

Upload Logo: Allows you to upload a logo into the default template.Logos must be in a .bmp format with maximum size parameters of 150pixels×50 pixels.

Upload Template: Allows you to upload a custom report template (textbased document) based on your desired criteria. Report templates arecreated using HTML coding. Once uploaded, the report is converted to aPDF when the “Generate Test Report” icon is selected.

Note: Some knowledge of HTML coding is required to create and upload acustom test report. If necessary, contact Snaptron for assistancecreating custom test reports.

Restore Default Template: This will reset the report template back tothe default template (ASTM standards).

Category 3: Process Control Mode

In certain models the user can apply limits to all ASTM values via anUpper Spec Limit (USL) and a Lower Spec Limit (LSL).

Fields for the ASTM standards are Fmax, Fmin, Frmax, Frmin, TfMax,TfMin, Fc/Fb, Tc/Tb, tease force, tease travel, free height, travel,tactile response slope, tactile recovery slope, tactile ratio,resistance threshold, final resistance.

When the Process Control Mode is Enabled, the front panel of the TruTactest station locks, and the top button on the unit is used to conductforce tests. Data is streamed from the TruTac test station, through thePC interface screen, to a text file. All ASTM values are saved in thetext file. The TruTac screen will indicate Pass or Fail if any one ofthe ASTM values entered in out of the selected range.

Category 4: Software Update

In certain models selecting the “Check for Update” in the SoftwareUpdate category will look for the latest version of the TruTac softwareand, if found, download and install the update.

Category 5: Network Settings

In certain models this allows you to adjust the network settings for theTruTac test station, including the host name, IP address, gateway,subnet, and DHCP server. Contact your IT professional or Snaptron forinformation regarding these settings.

System Components

-   -   TruTac test unit    -   0.050″ actuator tip    -   Power supply    -   Power cable        TuTac Test Station Specifications        Power Requirements:    -   Rated voltage (100-240VAC)    -   Line frequency (47-63 Hz    -   Current (2.2 A max. at 90 VAC input)        Weight:

-   TruTac (13.5 lbs.)

-   Power supply (1.5 lbs.)    Unit Dimensions:

-   11 W×11 L×10.2 H (in)    Screen Dimensions:

-   2.9 W×2.1 H (in)    Throat Dimensions:

-   3.1 H×5.0 D (in)    Power Supply Dimensions:

-   9.0 L×2.9 W×2.0 H (in)    Screen Resolution:

-   640×480 pixels    Software Compatibility:

-   Java Runtime Environment (version 1.5 or newer)    Testing Specifications (In Certain Models):    Curve Generation:    -   Force vs. displacement line graph    -   A graphical representation of a switch's tactile feel        Measurement Units:

-   Grams, 10-3 inch    Max Displacement:

-   0.60 (in.)    Max Force:

-   1200 (grams)    Displacement Accuracy:

-   +/−0.005 (in)    Force Accuracy:

-   +/−5 (grams)    Resistance Accuracy:

-   +/−0.00    Resistance Range:

-   0-1000 Ohms    Max Life Test Speed:

-   20 cycles per second    Max Life Test Stroke:

-   0.60 (in.)    Testing Terms/Explanations (Non-Binding, but Clarifying Explanations    may be as Follows):

Force: Mechanical resistance to motion (e.g., in grams or ounces).

Displacement: Measured distance of movement when a test object isdepressed (may be referred to as travel or deformation position).

Free Height: Measurement taken from the top of the test object to thesurface in which the switch is resting.

Travel: Displacement with specified start and finish; in case of aswitch, usually starts when force exceeds zero and finishes when switchcontact occurs.

Resistance: Electrical resistance as measured between two test pointswhose internal contacts, when held closed, complete a circuit.

Contact threshold: Indicates the threshold levels set for desiredresistance measurement of a switch.

Force curve (forward): Shows the hysteresis of the relationship betweenforce applied and displacement in the forward movement of a test object.

Release curve (return): Shows the hysteresis of the relationship betweenforce and displacement in the return movement of a test object.

Fmax (actuation force): Maximum force measured prior to or includingpoint (Fmin). Sometimes referred to as the actuation force.

Fmin (release force): Minimum force seen between Fmax and point at whichprobe movement ceases. Sometimes referred to as release force.

Frmax: Return max force. Maximum force measured during return cycleafter achieving Frmin.

Frmin: Return min force. Minimum force seen during return cycle beforereaching Frmax.

Tfmax: Displacement at Fmax (forward movement).

Tfmin: Displacement at Fmin (forward movement).

Tfrmax: Displacement at Frmax (return movement)

Tfrmin: Displacement at Frmin (return movement).

Fc: Contact force (the force at contact closure).

Fb: Break force (the force at contact break).

Tc: Contact displacement (the displacement at contact closure).

Tb: Break displacement (the displacement at contact break).

Tease force: The displacement measurement on the forcedisplacement curvebetween contact force (Fc) and minimum force (Fmin).

Tease travel: The amount of displacement where switch contact is notmade between contact force (Fc) and minimum force (Fmin).

Tactile response slope: Rate of change of applied force with respect todisplacement, as measured between Tfmax and Tfmin.

Tactile recovery slope: Rate of change of return force with respect todisplacement, as measured between Tfr min and TFrmax.

Tactile ratio: Combination of actuation force (Fmax) and release force(Fmin). Measured as Fmax−Fmin/Fmax (×100).

Resistance threshold: Point at which test object is considered actuated.Final resistance: Reading at end of test.

Care and Handling

-   -   When cleaning the LCD, buttons and cases, use a soft damp cloth        only. Do not use solvents or scouring agents.    -   Do not submerge the unit or power supply in any liquid.    -   Extra care should be taken when handling the force applicator        tip as the internal support bearing can be damaged.    -   Torque transmitted to the actuator shaft should be kept to a        minimum and not allowed to exceed 1.3 N-m (11 lbf-in).    -   The force applicator should be cleaned with a dry, lint free        cloth. It should be free of any visible contamination and should        more freely by hand.    -   When picking up or moving the test station, always hold it by        the support arm or the base of the unit.    -   Test tips are attached via threads that attach as part of the        force applicator. To remove a test tip, unscrew going counter        clockwise.    -   The TruTac may have pre-drilled and threaded platform holes for        custom tooling plate configurations. Never drill holes into the        base as it may damage the functionality of the unit.    -   It is recommended that calibrations of the TruTac test station        are conducted every 6 months in order to ensure the most        accurate readings.

As can be easily understood from the foregoing, the basic concepts ofthe present invention may be embodied in a variety of ways. It involvesboth deformation response testing techniques as well as devices toaccomplish the appropriate testing. In this application, the testingtechniques are disclosed as part of the results shown to be achieved bythe various devices described and as steps which are inherent toutilization. They are simply the natural result of utilizing the devicesas intended and described. In addition, while some devices aredisclosed, it should be understood that these not only accomplishcertain methods but also can be varied in a number of ways. Importantly,as to all of the foregoing, all of these facets should be understood tobe encompassed by this disclosure.

The discussion included in this international application is intended toserve as a basic description. The reader should be aware that thespecific discussion may not explicitly describe all embodimentspossible; many alternatives are implicit. It also may not fully explainthe generic nature of the invention and may not explicitly show how eachfeature or element can actually be representative of a broader functionor of a great variety of alternative or equivalent elements. Again,these are implicitly included in this disclosure. Where the invention isdescribed in device-oriented terminology, each element of the deviceimplicitly performs a function. Apparatus claims may not only beincluded for the device described, but also method or process claims maybe included to address the functions the invention and each elementperforms. Neither the description nor the terminology is intended tolimit the scope of the claims that will be included in any subsequentpatent application.

It should also be understood that a variety of changes may be madewithout departing from the essence of the invention. Such changes arealso implicitly included in the description. They still fall within thescope of this invention. A broad disclosure encompassing both theexplicit embodiment(s) shown, the great variety of implicit alternativeembodiments, and the broad methods or processes and the like areencompassed by this disclosure and may be relied upon when drafting theclaims for any subsequent patent application. It should be understoodthat such language changes and broader or more detailed claiming may beaccomplished at a later date (such as by any required deadline) or inthe event the applicant subsequently seeks a patent filing based on thisfiling. With this understanding, the reader should be aware that thisdisclosure is to be understood to support any subsequently filed patentapplication that may seek examination of as broad a base of claims asdeemed within the applicant's right and is designed to yield a patentcovering numerous aspects of the invention both independently and as anoverall system.

Further, each of the various elements of the invention and claims mayalso be achieved in a variety of manners. Additionally, when used orimplied, an element is to be understood as encompassing individual aswell as plural structures that may or may not be physically connected.This disclosure should be understood to encompass each such variation,be it a variation of an embodiment of any apparatus embodiment, a methodor process embodiment, or even merely a variation of any element ofthese. Particularly, it should be understood that as the disclosurerelates to elements of the invention, the words for each element may beexpressed by equivalent apparatus terms or method terms—even if only thefunction or result is the same. Such equivalent, broader, or even moregeneric terms should be considered to be encompassed in the descriptionof each element or action. Such terms can be substituted where desiredto make explicit the implicitly broad coverage to which this inventionis entitled. As but one example, it should be understood that allactions may be expressed as a means for taking that action or as anelement which causes that action. Similarly, each physical elementdisclosed should be understood to encompass a disclosure of the actionwhich that physical element facilitates. Regarding this last aspect, asbut one example, the disclosure of a “determiner” should be understoodto encompass disclosure of the act of “determining”—whether explicitlydiscussed or not—and, conversely, were there effectively disclosure ofthe act of “determining”, such a disclosure should be understood toencompass disclosure of a “determiner” and even a “means fordetermining” Such changes and alternative terms are to be understood tobe explicitly included in the description.

Any patents, publications, or other references mentioned in thisapplication for patent are hereby incorporated by reference. Anypriority case(s) claimed by this application is hereby appended andhereby incorporated by reference. In addition, as to each term used itshould be understood that unless its utilization in this application isinconsistent with a broadly supporting interpretation, common dictionarydefinitions should be understood as incorporated for each term and alldefinitions, alternative terms, and synonyms such as contained in theRandom House Webster's Unabridged Dictionary, second edition are herebyincorporated by reference. Finally, all references listed in anyinformation disclosure statement filed with the application are herebyappended and hereby incorporated by reference, however, as to each ofthe above, to the extent that such information or statementsincorporated by reference might be considered inconsistent with thepatenting of this/these invention(s) such statements are expressly notto be considered as made by the applicant(s).

Thus, the applicant(s) should be understood to have support to claim andmake a statement of invention to at least: i) each of the deformationresponse determination devices as herein disclosed and described, ii)the related methods disclosed and described, iii) similar, equivalent,and even implicit variations of each of these devices and methods, iv)those alternative designs which accomplish each of the functions shownas are disclosed and described, v) those alternative designs and methodswhich accomplish each of the functions shown as are implicit toaccomplish that which is disclosed and described, vi) each feature,component, and step shown as separate and independent inventions, vii)the applications enhanced by the various systems or componentsdisclosed, viii) the resulting products produced by such systems orcomponents, ix) each system, method, and element shown or described asnow applied to any specific field or devices mentioned, x) methods andapparatuses substantially as described hereinbefore and with referenceto any of the accompanying examples, xi) the various combinations andpermutations of each of the elements disclosed, xii) each potentiallydependent claim or concept as a dependency on each and every one of theindependent claims or concepts presented, and xiii) all inventionsdescribed herein.

In addition and as to computer aspects and each aspect amenable toprogramming or other electronic automation, the applicant(s) should beunderstood to have support to claim and make a statement of invention toat least: xvi) processes performed with the aid of or on a computer asdescribed throughout the above discussion, xv) a programmable apparatusas described throughout the above discussion, xvi) a computer readablememory encoded with data to direct a computer comprising means orelements which function as described throughout the above discussion,xvii) a computer configured as herein disclosed and described, xviii)individual or combined subroutines and programs as herein disclosed anddescribed, xix) the related methods disclosed and described, xx)similar, equivalent, and even implicit variations of each of thesesystems and methods, xxi) those alternative designs which accomplisheach of the functions shown as are disclosed and described, xxii) thosealternative designs and methods which accomplish each of the functionsshown as are implicit to accomplish that which is disclosed anddescribed, xxiii) each feature, component, and step shown as separateand independent inventions, and xxiv) the various combinations andpermutations of each of the above.

With regard to claims whether now or later presented for examination, itshould be understood that for practical reasons and so as to avoid greatexpansion of the examination burden, the applicant may at any timepresent only initial claims or perhaps only initial claims with onlyinitial dependencies. The office and any third persons interested inpotential scope of this or subsequent applications should understandthat broader claims may be presented at a later date in this case, in acase claiming the benefit of this case, or in any continuation in spiteof any preliminary amendments, other amendments, claim language, orarguments presented, thus throughout the pendency of any case there isno intention to disclaim or surrender any potential subject matter. Itshould be understood that if or when broader claims are presented, suchmay require that any relevant prior art that may have been considered atany prior time may need to be re-visited since it is possible that tothe extent any amendments, claim language, or arguments presented inthis or any subsequent application are considered as made to avoid suchprior art, such reasons may be eliminated by later presented claims orthe like. Both the examiner and any person otherwise interested inexisting or later potential coverage, or considering if there has at anytime been any possibility of an indication of disclaimer or surrender ofpotential coverage, should be aware that no such surrender or disclaimeris ever intended or ever exists in this or any subsequent application.Limitations such as arose in Hakim v. Cannon Avent Group, PLC, 479 F.3d1313 (Fed. Cir 2007), or the like are expressly not intended in this orany subsequent related matter. In addition, support should be understoodto exist to the degree required under new matter laws—including but notlimited to European Patent Convention Article 123(2) and United StatesPatent Law 35 USC 132 or other such laws—to permit the addition of anyof the various dependencies or other elements presented under oneindependent claim or concept as dependencies or elements under any otherindependent claim or concept. In drafting any claims at any time whetherin this application or in any subsequent application, it should also beunderstood that the applicant has intended to capture as full and broada scope of coverage as legally available. To the extent thatinsubstantial substitutes are made, to the extent that the applicant didnot in fact draft any claim so as to literally encompass any particularembodiment, and to the extent otherwise applicable, the applicant shouldnot be understood to have in any way intended to or actuallyrelinquished such coverage as the applicant simply may not have beenable to anticipate all eventualities; one skilled in the art, should notbe reasonably expected to have drafted a claim that would have literallyencompassed such alternative embodiments.

Further, if or when used, the use of the transitional phrase“comprising” is used to maintain the “open-end” claims herein, accordingto traditional claim interpretation. Thus, unless the context requiresotherwise, it should be understood that the term “comprise” orvariations such as “comprises” or “comprising”, are intended to implythe inclusion of a stated element or step or group of elements or stepsbut not the exclusion of any other element or step or group of elementsor steps. Such terms should be interpreted in their most expansive formso as to afford the applicant the broadest coverage legally permissible.

Finally, any claims set forth at any time are hereby incorporated byreference as part of this description of the invention, and theapplicant expressly reserves the right to use all of or a portion ofsuch incorporated content of such claims as additional description tosupport any of or all of the claims or any element or component thereof,and the applicant further expressly reserves the right to move anyportion of or all of the incorporated content of such claims or anyelement or component thereof from the description into the claims orvice-versa as necessary to define the matter for which protection issought by this application or by any subsequent continuation, division,or continuation-in-part application thereof, or to obtain any benefitof, reduction in fees pursuant to, or to comply with the patent laws,rules, or regulations of any country or treaty, and such contentincorporated by reference shall survive during the entire pendency ofthis application including any subsequent continuation, division, orcontinuation-in-part application thereof or any reissue or extensionthereon.

What is claimed is:
 1. An apparatus for determining test objectdeformation response, comprising: a force deliverer drive component thatmoves at a first speed and a first acceleration while delivering a driveforce; a deformation force deliverer to which said drive force isdelivered and that moves simultaneously with said force deliver drivecomponent at said first speed and said first acceleration to deliverdeformation force to a test object; and a test object responsedeterminer that determines a deformation response of said test object tosaid deformation force, said test object response determiner comprising:recorded drive component current versus test object deformationcalibration data for a plurality of drive forces and said test object;and a computer processor programmed to use said calibration data forsaid plurality of drive forces to transform measured test objectresponse data into generated test object response data, wherein saidgenerated test object response data comprises test object deformationposition versus deformation force data.
 2. An apparatus for determiningtest object deformation response as described in claim 1 furthercomprising an input adjuster that adjusts an input that affects motionof said deformation force deliverer so as to meet at least oneconstraint.
 3. An apparatus for determining test object deformationresponse as described in claim 1 wherein said at least one constraintcomprises a test object deformation speed constraint.
 4. An apparatusfor determining test object deformation response as described in claim 1wherein said at least one constraint comprises a test object deformationacceleration constraint.
 5. An apparatus for determining test objectdeformation response as described in claim 1 wherein said input adjustercomprises a servo-controller and a linear encoder.
 6. An apparatus fordetermining test object deformation response as described in claim 2wherein said generated test object response data comprises speed versusdeformation position data.
 7. An apparatus for determining test objectdeformation response as described in claim 6 wherein said at least oneconstraint comprises a test object deformation force constraint.
 8. Anapparatus for determining test object deformation response as describedin claim 6 wherein said input adjuster comprises said recordedcalibration data and a servo-controller.
 9. An apparatus for determiningtest object deformation response as described in claim 6 wherein saidtest object response determiner comprises a linear encoder.
 10. Anapparatus for determining test object deformation response as describedin claim 1 wherein said force deliverer drive is powered with a constantcurrent while a drive component thereof moves at said first speed andsaid first acceleration while delivering said drive force.
 11. Anapparatus for determining test object deformation response as describedin claim 10 wherein said generated test object response data comprisestest object deformation speed versus test object deformation positiondata.
 12. An apparatus for determining test object deformation responseas described in claim 1 wherein said force deliverer drive is poweredwith a varying current while a drive component thereof moves at saidfirst speed and said first acceleration while delivering said driveforce.
 13. An apparatus for determining test object deformation responseas described in claim 1 wherein said deformation force deliverer drivecomprises a linear actuator component.
 14. An apparatus for determiningtest object deformation response as described in claim 13 wherein saidlinear actuator comprises a voice coil linear actuator.
 15. An apparatusfor determining test object deformation response as described in claim14 wherein said voice coil linear actuator comprises a moving voice coillinear actuator.
 16. An apparatus for determining test objectdeformation response as described in claim 1 wherein said test objectcomprises a force activated switch dome.
 17. An apparatus fordetermining test object deformation response as described in claim 1wherein said test object response comprises hardness-related response.18. An apparatus for determining test object deformation response asdescribed in claim 1 wherein said test object response compriseselasticity response.
 19. An apparatus for determining test objectdeformation response as described in claim 1 wherein said test objectresponse comprises cyclical response.
 20. An apparatus for determiningtest object deformation response as described in claim 1 wherein saiddeformation force deliverer repeatedly delivers said deformation forceto said test object to determine cyclical failure response.
 21. Anapparatus for determining test object deformation response, comprising:a linear actuator that moves a deformation force deliverer that deliversdeformation force to a test object; a test object response determinerthat determines a response of said test object to said deformationforce; determined information relating drive component current, testobject deformation, and drive force for said test object, saiddetermined information determined from a plurality of known deformationforces; and a computer processor forming at least part of said testobject response determiner, said computer processor programmed to usesaid determined data to transform measured test object response datainto generated test object response data.
 22. An apparatus fordetermining test object deformation response as described in claim 21further comprising an input adjuster that adjusts an input that affectsmotion of said deformation force deliverer so as to meet at least oneconstraint.
 23. An apparatus for determining test object deformationresponse as described in claim 22 wherein said said generated testobject response data comprises test object deformation position versusdeformation force data.
 24. An apparatus for determining test objectdeformation response as described in claim 22 wherein said at least oneconstraint comprises a test object deformation speed constraint.
 25. Anapparatus for determining test object deformation response as describedin claim 22 wherein said at least one constraint comprises a test objectdeformation acceleration constraint.
 26. An apparatus for determiningtest object deformation response as described in claim 22 wherein saidinput adjuster comprises a linear encoder and a servo-controller.
 27. Anapparatus for determining test object deformation response as describedin claim 22 wherein said test object response determiner comprises saiddetermined information.
 28. An apparatus for determining test objectdeformation response as described in claim 22 wherein said generatedtest object response data comprises test object speed versus test objectdeformation position data.
 29. An apparatus for determining test objectdeformation response as described in claim 28 wherein said at least oneconstraint comprises a test object deformation force constraint.
 30. Anapparatus for determining test object deformation response as describedin claim 28 wherein said input adjuster comprises a servo-controller.31. An apparatus for determining test object deformation response asdescribed in claim 28 wherein said test object response determinercomprises a linear encoder.
 32. An apparatus for determining test objectdeformation response as described in claim 21 wherein said linearactuator is powered with a varying current while delivering a driveforce.
 33. An apparatus for determining test object deformation responseas described in claim 32 wherein said said generated test objectresponse data comprises test object deformation position versusdeformation force data.
 34. An apparatus for determining test objectdeformation response as described in claim 32 wherein said generatedtest object response data comprises test object deformation speed versustest object deformation position data.
 35. An apparatus for determiningtest object deformation response as described in claim 21 wherein saidlinear actuator is powered with a constant current while delivering adrive force.
 36. An apparatus for determining test object deformationresponse as described in claim 35 wherein said said generated testobject response data comprises test object deformation position versusdeformation force data.
 37. An apparatus for determining test objectdeformation response as described in claim 35 wherein said generatedtest object response comprises test object deformation speed versus testobject deformation position data.
 38. An apparatus for determining testobject deformation response as described in claim 21 wherein a drivecomponent of said linear actuator moves at a first speed and a firstacceleration.
 39. An apparatus for determining test object deformationresponse as described in claim 38 wherein said deformation forcedeliverer moves at said first speed and said first accelerationsimultaneously with said drive component.
 40. An apparatus fordetermining test object deformation response as described in claim 21wherein said test object comprises a force activated switch dome.
 41. Anapparatus for determining test object deformation response as describedin claim 21 wherein said test object response comprises hardness relatedresponse.
 42. An apparatus for determining test object deformationresponse as described in claim 21 wherein said test object responsecomprises elasticity response.
 43. An apparatus for determining testobject deformation response as described in claim 21 wherein said testobject response comprises cyclical response.
 44. An apparatus fordetermining test object deformation response as described in claim 21wherein said deformation force deliverer repeatedly delivers saiddeformation force to said test object to determine cyclical failureresponse.
 45. An apparatus for determining test object deformationresponse as described in claim 1 wherein said measured test objectresponse data comprises measured deformation position data, and knowncurrent.
 46. An apparatus for determining test object deformationresponse as described in claim 1 wherein said recorded drive componentcurrent versus test object deformation calibration data comprisesnumerical parameters of a mathematical relationship.
 47. An apparatusfor determining test object deformation response as described in claim21 wherein said measured test object response data comprises measureddeformation position data, and known current.
 48. An apparatus fordetermining test object deformation response as described in claim 21wherein said determined information comprises recorded drive componentcurrent versus test object deformation calibration data for a pluralityof drive forces.
 49. An apparatus for determining test objectdeformation response as described in claim 21 wherein said determinedinformation comprises a mathematical relationship usable to generateforce from said measured test object response data.